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	<title>TEST MAX</title>
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	<link>http://testmax.com.sg</link>
	<description>(We test it to the MAX)</description>
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		<title>New Testmax Contact Finger with 0.3mm pitch for true kelvin high current (17 Amp. @3ms) application (DZ12-80) added</title>
		<link>http://testmax.com.sg/2011/10/new-testmax-contact-finger-with-0-3mm-pitch-for-true-kelvin-high-current-application-dz12-80-added/</link>
		<comments>http://testmax.com.sg/2011/10/new-testmax-contact-finger-with-0-3mm-pitch-for-true-kelvin-high-current-application-dz12-80-added/#comments</comments>
		<pubDate>Wed, 05 Oct 2011 08:11:53 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[News]]></category>
		<category><![CDATA[Sticky]]></category>
		<category><![CDATA[0.3mm pitch]]></category>
		<category><![CDATA[Contact Finger]]></category>
		<category><![CDATA[dz12-80]]></category>
		<category><![CDATA[high current]]></category>
		<category><![CDATA[true kelvin]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=1545</guid>
		<description><![CDATA[Click on the photo above for more detail]]></description>
			<content:encoded><![CDATA[<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf52-testmax-design/"><img class="aligncenter size-full wp-image-1533" title="CF52P03V20_TestMaxDesign_DZ12-80_Shrink" src="http://testmax.com.sg/wp-content/uploads/2009/10/CF52P03V20_TestMaxDesign_DZ12-80_Shrink.jpg" alt="" width="500" height="429" /></a>Click on the photo above for more detail</p>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>New Multitest Contact Finger Ck1-441-00 added</title>
		<link>http://testmax.com.sg/2009/09/new-multitest-contact-finger-ck1-441-00-added/</link>
		<comments>http://testmax.com.sg/2009/09/new-multitest-contact-finger-ck1-441-00-added/#comments</comments>
		<pubDate>Wed, 09 Sep 2009 11:53:40 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[News]]></category>
		<category><![CDATA[Sticky]]></category>
		<category><![CDATA[ck1-441]]></category>
		<category><![CDATA[Contact Finger]]></category>
		<category><![CDATA[multitest]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=629</guid>
		<description><![CDATA[Click on the photo above for more detail]]></description>
			<content:encoded><![CDATA[<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf11-multitest/"><img class="size-full wp-image-627 aligncenter" title="ContactFinger_08_MULTITEST(CK)_13_CK1-441-00" src="http://testmax.com.sg/wp-content/uploads/2009/04/ContactFinger_08_MULTITESTCK_13_CK1-441-00.jpg" alt="ContactFinger_08_MULTITEST(CK)_13_CK1-441-00" width="560" height="420" /></a></p>
<p style="text-align: center;">Click on the photo above for more detail</p>
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		</item>
		<item>
		<title>New Contact Finger and Test Sockets Update</title>
		<link>http://testmax.com.sg/2009/06/new-contact-finger-and-test-sockets-update/</link>
		<comments>http://testmax.com.sg/2009/06/new-contact-finger-and-test-sockets-update/#comments</comments>
		<pubDate>Thu, 25 Jun 2009 11:13:20 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[News]]></category>
		<category><![CDATA[Sticky]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=592</guid>
		<description><![CDATA[Test Max is please to launch its new Contact Fingers and Test Sockets specially designed with the following features: 1) Small and Compact 2) Fine Pitch of 0.3mm with True kelvin included . High Current (17 Ampere @ 3mSec. &#62;High, 200mSec &#62;LOW) 3) Test Contact Resistance of 30mill Ohm. 4) Spacing of kelvin contact gap [...]]]></description>
			<content:encoded><![CDATA[<p>Test Max is please to launch its new Contact Fingers and Test Sockets specially designed with the following features:</p>
<p>1) Small and Compact<br />
2) Fine Pitch of 0.3mm with True kelvin included . High Current (17 Ampere @ 3mSec. &gt;High, 200mSec &gt;LOW)<br />
3) Test Contact Resistance of 30mill Ohm.<br />
4) Spacing of kelvin contact gap with min of 0.03mm.<br />
5) Compression of contact pin can travel to 0.5mm.</p>
<p>(Click on the image for detail)</p>
<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf52-testmax-design/" target="_self"><img class="aligncenter size-full wp-image-1465" title="CF52P01V23_TestMaxDesign_DZ48-56_Shrink" src="http://testmax.com.sg/wp-content/uploads/2009/06/CF52P01V23_TestMaxDesign_DZ48-56_Shrink.jpg" alt="CF52P01V23_TestMaxDesign_DZ48-56_Shrink" width="500" height="500" /></a></p>
<p style="text-align: center;">Note: Johnstech and Johnstech logos are trademarks of Johnstech International (<a href="http://www.johnstech.com/" target="_blank">http://www.johnstech.com/</a>). All rights reserved.</p>
<p style="text-align: center;">.</p>
<p style="text-align: center;"><a href="http://testmax.com.sg/2009/10/v2cf52-testmax-design/"><img class="aligncenter size-full wp-image-1367" title="CF52P02V20_TestMaxDesign_DZ3-19_Shrink" src="http://testmax.com.sg/wp-content/uploads/2009/10/CF52P02V20_TestMaxDesign_DZ3-19_Shrink.jpg" alt="CF52P02V20_TestMaxDesign_DZ3-19_Shrink" width="500" height="470" /></a></p>
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		</item>
		<item>
		<title>Patent</title>
		<link>http://testmax.com.sg/2009/04/patent/</link>
		<comments>http://testmax.com.sg/2009/04/patent/#comments</comments>
		<pubDate>Wed, 01 Apr 2009 09:28:16 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[testmax patents]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=554</guid>
		<description><![CDATA[The following are the links to our patent technology.. Please note that you need to have the password to access these pages. You may request for a free password by filling out our contact form here with subject &#8220;Request for Patent Information&#8221; (Please fill in your name, email, company and your expectation for Testmax). We [...]]]></description>
			<content:encoded><![CDATA[<p>The following are the links to our patent technology..</p>
<p>Please note that you need to have the password to access these pages. You may request for a free password by filling out our contact form <a href="http://testmax.com.sg/contact-us/" target="_blank">here</a> with subject &#8220;Request for Patent Information&#8221; (Please fill in your name, email, company and your expectation for Testmax). We will get back to you using email.</p>
<ul>
<li><a href="http://testmax.com.sg/2009/02/patent001-apparatus-for-facilitating-zero-insertion-of-a-burn-in-test-probe-into-a-socket/" target="_self">Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent002-connector-contact-fingers-for-testing-integrated-circuit-packages/" target="_self">Patent#002: Connector contact fingers for testing integrated circuit packages</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent003-electrical-contactor-for-testing-integrated-circuit-devices/" target="_self">Patent#003: Electrical contactor for testing integrated circuit devices</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent004-socket-contact-with-kelvin-contact-for-testing-integrated-circuit-devices/" target="_self">Patent#004: Socket contact with kelvin contact for testing integrated circuit devices </a></li>
<li><a href="http://testmax.com.sg/2009/02/patent005-probe-for-integrated-circuit-test-socket/" target="_self">Patent#005: Probe for integrated circuit test socket</a></li>
<li><a href="http://testmax.com.sg/2009/02/patent006-non-abrasive-electrical-test-contact/" target="_self">Patent#006: Non-abrasive electrical test contact</a></li>
</ul>
]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#006: Non-abrasive electrical test contact</title>
		<link>http://testmax.com.sg/2009/02/patent006-non-abrasive-electrical-test-contact/</link>
		<comments>http://testmax.com.sg/2009/02/patent006-non-abrasive-electrical-test-contact/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:40:49 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[electrical]]></category>
		<category><![CDATA[non abrasive]]></category>
		<category><![CDATA[test contact]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=298</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#005: Probe for integrated circuit test socket</title>
		<link>http://testmax.com.sg/2009/02/patent005-probe-for-integrated-circuit-test-socket/</link>
		<comments>http://testmax.com.sg/2009/02/patent005-probe-for-integrated-circuit-test-socket/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:21:13 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[integrated circuit]]></category>
		<category><![CDATA[Probe]]></category>
		<category><![CDATA[test socket]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=293</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#004: Socket contact with kelvin contact for testing integrated circuit devices</title>
		<link>http://testmax.com.sg/2009/02/patent004-socket-contact-with-kelvin-contact-for-testing-integrated-circuit-devices/</link>
		<comments>http://testmax.com.sg/2009/02/patent004-socket-contact-with-kelvin-contact-for-testing-integrated-circuit-devices/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:11:53 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[integrated circuit]]></category>
		<category><![CDATA[kelvin contact]]></category>
		<category><![CDATA[socket contact]]></category>
		<category><![CDATA[testing]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=289</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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]]></content:encoded>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#003: Electrical contactor for testing integrated circuit devices</title>
		<link>http://testmax.com.sg/2009/02/patent003-electrical-contactor-for-testing-integrated-circuit-devices/</link>
		<comments>http://testmax.com.sg/2009/02/patent003-electrical-contactor-for-testing-integrated-circuit-devices/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 10:03:50 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[device]]></category>
		<category><![CDATA[electrical contactor]]></category>
		<category><![CDATA[integrated circuit]]></category>
		<category><![CDATA[testing]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=284</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#002: Connector contact fingers for testing integrated circuit packages</title>
		<link>http://testmax.com.sg/2009/02/patent002-connector-contact-fingers-for-testing-integrated-circuit-packages/</link>
		<comments>http://testmax.com.sg/2009/02/patent002-connector-contact-fingers-for-testing-integrated-circuit-packages/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 09:45:40 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[connector]]></category>
		<category><![CDATA[Contact Finger]]></category>
		<category><![CDATA[integrated circuit package]]></category>
		<category><![CDATA[testing]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=277</guid>
		<description><![CDATA[There is no excerpt because this is a protected post.]]></description>
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		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Protected: Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket</title>
		<link>http://testmax.com.sg/2009/02/patent001-apparatus-for-facilitating-zero-insertion-of-a-burn-in-test-probe-into-a-socket/</link>
		<comments>http://testmax.com.sg/2009/02/patent001-apparatus-for-facilitating-zero-insertion-of-a-burn-in-test-probe-into-a-socket/#comments</comments>
		<pubDate>Thu, 05 Feb 2009 09:29:23 +0000</pubDate>
		<dc:creator>admin</dc:creator>
				<category><![CDATA[Patent]]></category>
		<category><![CDATA[Apparatus]]></category>
		<category><![CDATA[burn in test probe]]></category>
		<category><![CDATA[zero insertion]]></category>

		<guid isPermaLink="false">http://testmax.com.sg/?p=267</guid>
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		<slash:comments>1</slash:comments>
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