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• Patent#001: Apparatus for facilitating zero-insertion of a burn-in test probe into a socket
• Patent#002: Connector contact fingers for testing integrated circuit packages
• Patent#003: Electrical contactor for testing integrated circuit devices
• Patent#004: Socket contact with kelvin contact for testing integrated circuit devices
• Patent#005: Probe for integrated circuit test socket
• Patent#006: Non-abrasive electrical test contact

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